TCAD simulation of current filamentation in adjacent IGBT cells under turn-on and turn-off short circuit condition
Suzuki, Hiroshi, Ciappa, MauroLanguage:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2015.06.110
Date:
July, 2015
File:
PDF, 2.17 MB
english, 2015