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SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] Application of Tunable Diode and Other Infrared Sources for Atmospheric Studies and Industrial Process Monitoring - Application of near-infrared TDLAS systems to HF measurements in aluminum smelters
Schiff, Harold I., Nadler, Sasha D., Pisano, John T., Mackay, Gervase I., Fried, AlanVolume:
2834
Year:
1996
Language:
english
DOI:
10.1117/12.255326
File:
PDF, 404 KB
english, 1996