An experiment in estimating reliability growth under both...

An experiment in estimating reliability growth under both representative and directed testing

Mitchell, Brian, Zeil, Steven J.
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Volume:
23
Language:
english
Journal:
ACM SIGSOFT Software Engineering Notes
DOI:
10.1145/271775.271784
Date:
March, 1998
File:
PDF, 792 KB
english, 1998
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