Analysis and simulation for a model of electron impact...

Analysis and simulation for a model of electron impact excitation/deexcitation and ionization/recombination

Yan, Bokai, Caflisch, Russel E., Barekat, Farzin, Cambier, Jean-Luc
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Volume:
299
Language:
english
Journal:
Journal of Computational Physics
DOI:
10.1016/j.jcp.2015.07.027
Date:
October, 2015
File:
PDF, 1.42 MB
english, 2015
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