Prediction of proton cross sections for SEU in SRAMs and...

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Microelectronics Reliability 2015 / 7

Prediction of proton cross sections for SEU in SRAMs and SDRAMs using the METIS engineer tool

Weulersse, C., Miller, F., Carrière, T., Mangeret, R.
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Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2015.06.117
Date:
July, 2015
File:
PDF, 1.88 MB
english, 2015
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