The distribution of the barrier height in Al–TiW–Pd 2 Si/n-Si Schottky diodes from I – V – T measurements
Dökme, Ilbilge, Altındal, Şemsettin, Afandiyeva, Izzet MVolume:
23
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/23/3/035003
Date:
March, 2008
File:
PDF, 266 KB
english, 2008