SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Modeling Aspects in Optical Metrology V - Phase error analysis and compensation in fringe projection profilometry
Bodermann, Bernd, Frenner, Karsten, Silver, Richard M., Bräuer-Burchardt, Christian, Kühmstedt, Peter, Notni, GuntherVolume:
9526
Year:
2015
Language:
english
DOI:
10.1117/12.2184638
File:
PDF, 336 KB
english, 2015