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[ACM Press the 2006 conference - Yokohama, Japan (2006.01.24-2006.01.27)] Proceedings of the 2006 conference on Asia South Pacific design automation - ASP-DAC '06 - Compaction of pass/fail-based diagnostic test vectors for combinational and sequential circuits
Higami, Yoshinobu, Saluja, Kewal K., Takahashi, Hiroshi, Kobayashi, Shin-ya, Takamatsu, YuzoYear:
2006
Language:
english
DOI:
10.1145/1118299.1118455
File:
PDF, 149 KB
english, 2006