[ACM Press the 17th ACM SIGKDD international conference -...

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[ACM Press the 17th ACM SIGKDD international conference - San Diego, California, USA (2011.08.21-2011.08.24)] Proceedings of the 17th ACM SIGKDD international conference on Knowledge discovery and data mining - KDD '11 - Direct local pattern sampling by efficient two-step random procedures

Boley, Mario, Lucchese, Claudio, Paurat, Daniel, Gärtner, Thomas
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Year:
2011
Language:
english
DOI:
10.1145/2020408.2020500
File:
PDF, 837 KB
english, 2011
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