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Characterization of polymeric thin films for photovoltaic applications by spectroscopic ellipsometry
Schmiedova, V., Heinrichova, P., Zmeskal, O., Weiter, M.Volume:
349
Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2015.05.027
Date:
September, 2015
File:
PDF, 2.04 MB
english, 2015