Current–voltage and capacitance–voltage characteristics of Al Schottky contacts to strained Si-on-insulator in the wide temperature range
Jyothi, I., Janardhanam, V., Hong, Hyobong, Choi, Chel-JongVolume:
39
Language:
english
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2015.05.043
Date:
November, 2015
File:
PDF, 2.60 MB
english, 2015