Effect of AlN buffer layer thickness on the properties of GaN films grown by pulsed laser deposition
Yang, Weijia, Wang, Wenliang, Liu, Zuolian, Li, GuoqiangVolume:
39
Language:
english
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2015.05.046
Date:
November, 2015
File:
PDF, 2.75 MB
english, 2015