[ACM Press the 33rd ACM SIGPLAN conference - Beijing, China (2012.06.11-2012.06.16)] Proceedings of the 33rd ACM SIGPLAN conference on Programming Language Design and Implementation - PLDI '12 - Test-case reduction for C compiler bugs
Regehr, John, Chen, Yang, Cuoq, Pascal, Eide, Eric, Ellison, Chucky, Yang, XuejunYear:
2012
Language:
english
DOI:
10.1145/2254064.2254104
File:
PDF, 615 KB
english, 2012