Correlation between interface modification and rectifying...

Applied Physics A: Materials Science & Processing 2015 / 10 Vol. 121; Iss. 1

Correlation between interface modification and rectifying behavior of p-type Cu2ZnSnS4/n-type Si diodes

Lin, Yow-Jon, Ruan, Cheng-He, Chu, Yu-Ju, Liu, Chia-Jyi, Lin, Fei-Hung
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Volume:
121
Language:
english
Journal:
Applied Physics A
DOI:
10.1007/s00339-015-9390-y
Date:
October, 2015
File:
PDF, 997 KB
english, 2015
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