Differential Thickness Layer Resistance Measurement method...

Differential Thickness Layer Resistance Measurement method for measurements of contact resistance of organic semiconductor thin films

Náhlík, Josef, Heřmanová, Martina, Boháček, Jan, Fitl, Přemysl, Vrňata, Martin
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
74
Language:
english
Journal:
Measurement
DOI:
10.1016/j.measurement.2015.07.025
Date:
October, 2015
File:
PDF, 652 KB
english, 2015
Conversion to is in progress
Conversion to is failed