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Differential Thickness Layer Resistance Measurement method for measurements of contact resistance of organic semiconductor thin films
Náhlík, Josef, Heřmanová, Martina, Boháček, Jan, Fitl, Přemysl, Vrňata, MartinVolume:
74
Language:
english
Journal:
Measurement
DOI:
10.1016/j.measurement.2015.07.025
Date:
October, 2015
File:
PDF, 652 KB
english, 2015