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Anomaly detection for IGBTs using Mahalanobis distance
Patil, Nishad, Das, Diganta, Pecht, MichaelVolume:
55
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2015.04.001
Date:
June, 2015
File:
PDF, 842 KB
english, 2015