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[AIP SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES: 12th International Conference STM'03 - Eindhoven (NETHERLANDS) (21-25 July 2003)] AIP Conference Proceedings - STM-BH Imaging of Subsurface Dopant Atoms on Hydrogen-Terminated Si(111)
Kurokawa, ShuVolume:
696
Year:
2003
Language:
english
DOI:
10.1063/1.1639765
File:
PDF, 192 KB
english, 2003