![](/img/cover-not-exists.png)
[AIP SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES: 12th International Conference STM'03 - Eindhoven (NETHERLANDS) (21-25 July 2003)] AIP Conference Proceedings - Polarization Properties Of Fully Metal Coated Scanning Near-Field Optical Microscopy Probes
Aeschimann, LaureVolume:
696
Year:
2003
Language:
english
DOI:
10.1063/1.1639801
File:
PDF, 286 KB
english, 2003