[AIP ADVANCES IN CRYOGENIC ENGINEERING: Transactions of the Cryogenic Engineering Conference - CEC - Keystone, Colorado (USA) (29 August-2 Septembe)] AIP Conference Proceedings - A Novel Short Sample Mounting Fixture for Critical Current Measurements
Chesny, Ph.Volume:
823
Year:
2006
Language:
english
DOI:
10.1063/1.2202570
File:
PDF, 1.04 MB
english, 2006