[AIP SYNCHROTRON RADIATION INSTRUMENTATION: Ninth International Conference on Synchrotron Radiation Instrumentation - Daegu (Korea) (28 May-2 June 2006)] AIP Conference Proceedings - Time-Resolved X-Ray Triple-Crystal Diffractometry Probing Dynamic Strain in Semiconductors
Hayashi, Yujiro, Tanaka, Yoshihito, Kirimura, Tomoyuki, Tsukuda, Noboru, Kuramoto, Eiichi, Ishikawa, TetsuyaVolume:
879
Year:
2007
Language:
english
DOI:
10.1063/1.2436293
File:
PDF, 1.66 MB
english, 2007