[AIP NOISE AND FLUCTUATIONS: 19th International Conference on Noise and Fluctuations; ICNF 2007 - Tokyo (Japan) (9-14 September 2007)] AIP Conference Proceedings - Generation-Recombination Defects In AlGaN/GaN HEMT On SiC Substrate, Evidenced By Low Frequency Noise Measurements And SIMS Characterization

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