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[AIP CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007 International Conference on Frontiers of Characterization and Metrology - Gaithersburg, MD (27-29 March 2007)] AIP Conference Proceedings - Thin-Film Nanocalorimetry: A New Approach to the Evaluation of Interfacial Stability for Nanoelectronic Applications
Cook, L. P., Cavicchi, R. E., Green, M. L., Montgomery, C. B., Egelhoff, W. F., Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C. Michael, Herr, Dan, Khosla, Rajinder P., Secula, ErikVolume:
931
Year:
2007
Language:
english
DOI:
10.1063/1.2799361
File:
PDF, 935 KB
english, 2007