![](/img/cover-not-exists.png)
[AIP CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007 International Conference on Frontiers of Characterization and Metrology - Gaithersburg, MD (27-29 March 2007)] AIP Conference Proceedings - The Characterization of Silicon-Based Molecular Devices
Gergel-Hackett, N., Hacker, C. A., Richter, L. J., Kirillov, O. A., Richter, C. A., Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C. Michael, Herr, Dan, Khosla, Rajinder P., Secula, EVolume:
931
Year:
2007
Language:
english
DOI:
10.1063/1.2799419
File:
PDF, 367 KB
english, 2007