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DNA adsorption at functionalized Si/buffer interfaces studied by x-ray reflectivity
Douarche, C., Cortès, R., Henry de Villeneuve, C., Roser, S. J., Braslau, A.Volume:
128
Year:
2008
Language:
english
Journal:
The Journal of Chemical Physics
DOI:
10.1063/1.2927256
File:
PDF, 2.73 MB
english, 2008