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[AIP NOISE AND FLUCTUATIONS: 20th International Conference on Noice and Fluctuations (ICNF-2009) - Pisa (Italy) (14–19 June 2009)] AIP Conference Proceedings - Low Frequency Noise Degradation in 45 nm High-k nMOSFETs due to Hot Carrier and Constant Voltage Stress
Rahman, M. Shahriar, Çelik-Butler, Zeynep, Quevedo-Lopez, M. A., Shanware, Ajit, Colombo, Luigi, Macucci, Massimo, Basso, GiovanniYear:
2009
Language:
english
DOI:
10.1063/1.3140447
File:
PDF, 225 KB
english, 2009