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[AIP NOISE AND FLUCTUATIONS: 20th International Conference on Noice and Fluctuations (ICNF-2009) - Pisa (Italy) (14–19 June 2009)] AIP Conference Proceedings - Influence of Dopant Profiles and Traps on the Low Frequency Noise of Four Gate Transistors
Rodríguez, A. Luque, Tejada, J. A. Jiménez, Villanueva, J. A. López, Godoy, A., Bullejos, P. Lara, Gómez-Campos, M., Macucci, Massimo, Basso, GiovanniYear:
2009
Language:
english
DOI:
10.1063/1.3140542
File:
PDF, 408 KB
english, 2009