[AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2009 - Albany (New York) (11–15 May 2009)] AIP Conference Proceedings - Electrical Measurements By Scanning Spreading Resistance Microscopy: Application To Carbon Nanofibers And Si Nanowires
Chevalier, N., Mariolle, D., Fourdrinier, L., Celle, C., Mouchet, C., Poncet, S., Simonato, J. P., Le Poche, H., Rouviere, E., Bertin, F., Chabli, A., Secula, Erik M., Seiler, David G., Khosla, RajindYear:
2009
Language:
english
DOI:
10.1063/1.3251235
File:
PDF, 3.33 MB
english, 2009