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[AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2009 - Albany (New York) (11–15 May 2009)] AIP Conference Proceedings - Quantifying and enforcing two-dimensional symmetries in scanning probe microscopy images
Moeck, Peter, Toader, Marius, Abdel-Hafiez, Mahmoud, Hietschold, Michael, Secula, Erik M., Seiler, David G., Khosla, Rajinder P., Herr, Dan, Michael Garner, C., McDonald, Robert, Diebold, Alain C.Year:
2009
Language:
english
DOI:
10.1063/1.3251237
File:
PDF, 3.69 MB
english, 2009