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[AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2009 - Albany (New York) (11–15 May 2009)] AIP Conference Proceedings - Application Of Statistical Dynamical X-ray Diffraction Theory To Defective Semiconductor Heterostructures

Shreeman, P. K., Matyi, R. J., Secula, Erik M., Seiler, David G., Khosla, Rajinder P., Herr, Dan, Michael Garner, C., McDonald, Robert, Diebold, Alain C.
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Year:
2009
Language:
english
DOI:
10.1063/1.3251255
File:
PDF, 1.03 MB
english, 2009
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