![](/img/cover-not-exists.png)
AIP Conference Proceedings [AIP THIRD MANUFACTURING ENGINEERING SOCIETY INTERNATIONAL CONFERENCE: MESIC-09 - Alcoy (Spain) (17–19 June 2009)] - Traceability In The Calibration Of Low Cost Opto-Electronic Sensors For Measuring 2D Displacement
Yagüe, J. A., Aguilar, J. J., Valenzuela, M., Lope, M. A., Segui, Vicente JesusYear:
2009
Language:
english
DOI:
10.1063/1.3273637
File:
PDF, 2.64 MB
english, 2009