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AIP Conference Proceedings [AIP INTERNATIONAL CONFERENCE ON ADVANCED PHASE MEASUREMENT METHODS IN OPTICS AND IMAGING - Monte Verita (Ascona) (16–21 May 2010)] - Real-Time Shape Measurement by Grating Projection Method Applied to Electronic Packaging
Masaya, Akihiro, Fujigaki, Motoharu, Morimoto, Yoshiharu, Rastogi, Pramod K., Hack, ErwinYear:
2010
Language:
english
DOI:
10.1063/1.3426150
File:
PDF, 355 KB
english, 2010