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AIP Conference Proceedings [AIP XXII INTERNATIONAL CONFERENCE ON RAMAN SPECTROSCOPY - Boston (MA) (8–10 August 2010)] - High Lateral Resolution Analysis Of Stresses In Silver Thin Films By Means Of Raman Microscopy
Wermelinger, Thomas, Scott, Shelley A., Lagally, Max G., Hinderling, Christian, Spoleank, Ralph, Champion, P. M., Ziegler, L. D.Year:
2010
Language:
english
DOI:
10.1063/1.3482804
File:
PDF, 142 KB
english, 2010