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AIP Conference Proceedings [AIP 2010 WIDE BANDGAP CUBIC SEMICONDUCTORS: FROM GROWTH TO DEVICES: Proceedings of the E-MRS Symposium∗ F∗ - Strasbourg, (France) (8–10 October 2010)] - Defects and Polytypism in SiC: The Role of Diffuse X-Ray Scattering
Boulle, A., Dompoint, D., Galben-Sandulache, I., Chaussende, D., Ferro, Gabriel, Siffert, PaulYear:
2010
Language:
english
DOI:
10.1063/1.3518307
File:
PDF, 725 KB
english, 2010