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AIP Conference Proceedings [AIP INTERNATIONAL WORKSHOP ON X-RAY AND NEUTRON PHASE IMAGING WITH GRATINGS - Tokyo, Japan (5–7 March 2012)] - X-ray grating interferometry - Applications in metrology and wave front sensing
David, Christian, Rutishauser, Simon, Sprung, Michael, Zanette, Irene, Weitkamp, TimmYear:
2012
Language:
english
DOI:
10.1063/1.4742264
File:
PDF, 336 KB
english, 2012