Identification of electron and hole trap based on...

Journal of Applied Physics 2013 Vol. 113; Iss. 8

Identification of electron and hole trap based on isothermal surface potential decay model

Shen, Wen-Wei, Mu, Hai-Bao, Zhang, Guan-Jun, Deng, Jun-Bo, Tu, De-Min
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Volume:
113
Year:
2013
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4792491
File:
PDF, 565 KB
english, 2013
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