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AIP Conference Proceedings [AIP PROCEEDING OF INTERNATIONAL CONFERENCE ON RECENT TRENDS IN APPLIED PHYSICS AND MATERIAL SCIENCE: RAM 2013 - Bikaner, Rajasthan, India (1–2 February 2013)] - Determination of refractive index and thickness of thin-film from reflectivity spectrum using genetic algorithm
Patel, Sanjaykumar J., Kheraj, VipulYear:
2013
Language:
english
DOI:
10.1063/1.4810324
File:
PDF, 232 KB
english, 2013