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AIP Conference Proceedings [AIP THE PHYSICS OF SEMICONDUCTORS: Proceedings of the 31st International Conference on the Physics of Semiconductors (ICPS) 2012 - Zurich, Switzerland (29 July–3 August 2012)] - Strain-induced reduction of surface roughness dominated spin relaxation in MOSFETs
Osintsev, Dmitri, Stanojevic, Zlatan, Baumgartner, Oskar, Sverdlov, Viktor, Selberherr, SiegfriedYear:
2013
Language:
english
DOI:
10.1063/1.4848413
File:
PDF, 313 KB
english, 2013