![](/img/cover-not-exists.png)
AIP Conference Proceedings [AIP Publishing LLC INTERNATIONAL CONFERENCE ON DEFECTS IN SEMICONDUCTORS 2013: Proceedings of the 27th International Conference on Defects in Semiconductors, ICDS-2013 - Bologna, Italy (21–26 July 2013)] - Interface defects in SiC power MOSFETs - An electrically detected magnetic resonance study based on spin dependent recombination
Gruber, Gernot, Hadley, Peter, Koch, Markus, Peters, Dethard, Aichinger, ThomasYear:
2014
Language:
english
DOI:
10.1063/1.4865627
File:
PDF, 179 KB
english, 2014