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AIP Conference Proceedings [AIP Publishing LLC INTERNATIONAL CONFERENCE ON DEFECTS IN SEMICONDUCTORS 2013: Proceedings of the 27th International Conference on Defects in Semiconductors, ICDS-2013 - Bologna, Italy (21–26 July 2013)] - Thickness dependence of electrical transport: A test for surface conduction in topological insulators
Barua, Sourabh, Rajeev, K. P.Year:
2014
Language:
english
DOI:
10.1063/1.4865630
File:
PDF, 174 KB
english, 2014