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AIP Conference Proceedings [AIP Publishing LLC SOLID STATE PHYSICS: Proceedings of the 58th DAE Solid State Physics Symposium 2013 - Thapar University, Patiala, Punjab, India (17–21 December 2013)] - Secondary electron measurement and XPS characterization of NEG coatings
Sharma, R. K., Sinha, Atul K., Gupta, Nidhi, Nuwad, J., Jagannath,, Gadkari, S. C., Singh, M. R., Gupta, S. K.Year:
2014
Language:
english
DOI:
10.1063/1.4872801
File:
PDF, 148 KB
english, 2014