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Temperature dependent behavior of thermal conductivity of sub-5 nm Ir film: Defect-electron scattering quantified by residual thermal resistivity
Cheng, Zhe, Xu, Zaoli, Xu, Shen, Wang, XinweiVolume:
117
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4905607
Date:
January, 2015
File:
PDF, 2.28 MB
english, 2015