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Influence of deep level defects on carrier lifetime in CdZnTe:In
Guo, Rongrong, Jie, Wanqi, Wang, Ning, Zha, Gangqiang, Xu, Yadong, Wang, Tao, Fu, XuVolume:
117
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4914159
Date:
March, 2015
File:
PDF, 611 KB
english, 2015