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Stability and migration of small copper clusters in amorphous dielectrics
Guzman, David M., Onofrio, Nicolas, Strachan, AlejandroVolume:
117
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4921059
Date:
May, 2015
File:
PDF, 1.51 MB
english, 2015