Particle image pattern mutual information...

Measurement Science and Technology 2015 / 07 Vol. 26; Iss. 7

Particle image pattern mutual information and uncertainty estimation for particle image velocimetry

Xue, Zhenyu, Charonko, John J, Vlachos, Pavlos P
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Volume:
26
Language:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/26/7/074001
Date:
July, 2015
File:
PDF, 2.28 MB
english, 2015
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