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Optimized wafer-probe and assembled package test design for analog circuits
Bhattacharya, Soumendu, Chatterjee, AbhijitVolume:
10
Language:
english
Journal:
ACM Transactions on Design Automation of Electronic Systems
DOI:
10.1145/1059876.1059882
Date:
April, 2005
File:
PDF, 1.21 MB
english, 2005