[ACM Press the 20th IEEE/ACM international Conference - Long Beach, CA, USA (2005.11.07-2005.11.11)] Proceedings of the 20th IEEE/ACM international Conference on Automated software engineering - ASE '05 - A similarity-aware approach to testing based fault localization
Hao, Dan, Pan, Ying, Zhang, Lu, Zhao, Wei, Mei, Hong, Sun, JiasuYear:
2005
Language:
english
DOI:
10.1145/1101908.1101953
File:
PDF, 245 KB
english, 2005