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[ACM Press the 2005 conference - Shanghai, China (2005.01.18-2005.01.21)] Proceedings of the 2005 conference on Asia South Pacific design automation - ASP-DAC '05 - Cluster-based detection of SEU-caused errors in LUTs of SRAM-based FPGAs
Reddy, E. Syam Sundar, Chandrasekhar, Vikram, Sashikanth, M., Kamakoti, V., Vijaykrishnan, N.Year:
2005
Language:
english
DOI:
10.1145/1120725.1120940
File:
PDF, 330 KB
english, 2005