[ACM Press the 2006 ACM/IEEE international symposium - Rio de Janeiro, Brazil (2006.09.21-2006.09.22)] Proceedings of the 2006 ACM/IEEE international symposium on International symposium on empirical software engineering - ISESE '06 - Identifying domain-specific defect classes using inspections and change history
Nakamura, Taiga, Hochstein, Lorin, Basili, Victor R.Year:
2006
Language:
english
DOI:
10.1145/1159733.1159785
File:
PDF, 316 KB
english, 2006