[ACM Press the 28th conference - San Francisco, California, United States (1991.06.17-1991.06.22)] Proceedings of the 28th conference on ACM/IEEE design automation conference - DAC '91 - Optimal ordering of analog integrated circuit tests to minimize test time
Huss, Scott D., Gyurcsik, Ronald S.Year:
1991
Language:
english
DOI:
10.1145/127601.127718
File:
PDF, 548 KB
english, 1991