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Power-aware SoC test planning for effective utilization of port-scalable testers
Sehgal, Anuja, Bahukudumbi, Sudarshan, Chakrabarty, KrishnenduVolume:
13
Language:
english
Journal:
ACM Transactions on Design Automation of Electronic Systems
DOI:
10.1145/1367045.1367062
Date:
July, 2008
File:
PDF, 244 KB
english, 2008